单电子晶体管中低频散粒噪声的特性分析(英文)

ANALYSIS OF CHARACTERISTICS OF FINITE_FREQUENCY SHOT NOISE IN A SINGLE_ELECTRONIC TRANSISTOR

本文中，我们将双结系统的散粒噪声理论应用于单电子晶体管中，并准确地推导出两态情况下单电子晶体管噪声谱的解析表达式．进而对单电子晶体管中引起散粒噪声的因素作了简要的讨论．

By applying the theory of shot noise S(ω) in a double_tunneling_junction system to the single_electronic transister (SET), derived in this paper is an exact analytical expression of the shot noise spectrum at two states, by which the factors casued noises in a SET is investigated.