集成电路故障诊断方法研究

Research on Methools of IC Faults Diagnosis

集成电路的故障诊断分为故障检测和故障定位。以往的检测,只是施加测试以判断被测电路是否存在故障,但不能对故障进行定位、确定故障类型、明确故障发生的根本原因,必须进一步分析测试的结果,确定故障的性质,以便在集成电路设计或工艺环节进行改进。随着技术的不断发展,对芯片故障诊断特别是其中的故障定位的要求也越来越高。本文介绍了故障诊断的常见策略和基于电流的集成电路诊断方法。

Faults diagnosis of Integrate Circuit （IC） is composed of faults detection and location. The traditional detection, which functioned to detect whether the circuit has faults or not, can not locate, rank or find out the root reason of the faults. So further analysis is needed to identify the types of faults and modify the functional design or electronic design. As the development of IC technology, faults diagnosis which focuses on faults location is becoming critical increasingly. Some traditional methods about diagnosis and faults diagnosis technology based on circuit information are introduced .