摘要
研究了Si3N4陶瓷材料及镀膜Ti/Si3N4材料当N+注入前后的摩擦学行为,考察了样品表面划痕轨迹的SEM形貌,结合X射线衍射,对离子注入改性机理和摩擦学性能进行了探讨.
In this paper, the tribological properties of Si3N4 and Ti/Si3N4 implanted by N ions are studied. The topography of implanting and scratching trace were examined using SEM. By X-ray diffraction for the implanted thin film, the new phase of Ti2N on Ti/Si3N4 layer by N+ implantation was shown. The wear and friction mechanism are also discussed in the paper. Ion beam mixing of interface improves the adhesion between Ti film and Si3N4 substrate.
出处
《硅酸盐学报》
EI
CAS
CSCD
北大核心
1998年第2期206-209,共4页
Journal of The Chinese Ceramic Society
关键词
离子注入
摩擦学
氮化硅陶瓷
钛
镀膜
ion implanting, Ti/Si3N4, tribological properties, ion beam mixing