摘要
本文采用导模法生长出了白宝石(1102)片晶和(0001)棒晶.在此基础上实验观察了白宝石单晶中的位错、亚晶界和小品面等缺陷的形态、数量及分布,讨论了生长条件对它们的影响.结果表明,晶体生长速率和籽晶质量是影响晶体缺陷的两个主要因素.
? Sapphire (1102) ribbon and (0001) bar were prepared by tile EFG methods and its crystal defects, such as dislocation, subgrain boundary as well as faceting plane were investingated experimentally. The influence of growth process on crystal defects was discussed. It was found that crystal growth rate and the quality of seed crystals were the two critical factors ti.hich affect the formation of defects in sapphire single crystals.
出处
《无机材料学报》
SCIE
EI
CAS
CSCD
北大核心
1998年第1期91-94,共4页
Journal of Inorganic Materials
关键词
导模法
白宝石
单晶
晶体缺陷
晶体生长
the EFG method, sapphire single crystal, crystal defect, crystal growth rate