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Study of X-ray Kirkpatrick-Baez imaging with single layer 被引量：2

Study of X-ray Kirkpatrick-Baez imaging with single layer
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摘要 The X-ray Kirkpatrick-Baez （KB） imaging experiment with single layer is implemented. Based on the astigmatism aberration and residual geometric aberration of a single mirror, a KB system with 16^x mean magnification and approximately 0.45°grazing incidence angle is designed. The mirrors are deposited with an Ir layer of 20-am thickness. Au grids backlit by X-ray tube of 8 keV are imaged via the KB system on scintillator charge-coupled device （CCD）. In the ±80 #m field, resolutions of less than 5 #m are measured. The result is in good agreement with the simulated imaging. The X-ray Kirkpatrick-Baez （KB） imaging experiment with single layer is implemented. Based on the astigmatism aberration and residual geometric aberration of a single mirror, a KB system with 16^x mean magnification and approximately 0.45°grazing incidence angle is designed. The mirrors are deposited with an Ir layer of 20-am thickness. Au grids backlit by X-ray tube of 8 keV are imaged via the KB system on scintillator charge-coupled device （CCD）. In the ±80 #m field, resolutions of less than 5 #m are measured. The result is in good agreement with the simulated imaging.
作者 穆宝忠 王占山 伊圣振 王新 黄圣铃 朱京涛 黄承超
机构地区 Institute of Precision Optical Engineering
出处 《Chinese Optics Letters》 SCIE EI CAS CSCD 2009年第5期452-454,共3页 中国光学快报（英文版）
基金 supported by the National "863" Program of China
关键词 Charge coupled devices Geometrical optics IRIDIUM Mirrors X ray tubes Charge coupled devices   Geometrical optics   Iridium   Mirrors   X ray tubes
分类号 O434.1 [机械工程—光学工程]
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参考文献14

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同被引文献16

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Chinese Optics Letters
2009年 第5期

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