颗粒粒度分布分辨率的研究

Research on Resolution of Particle Size Distribution

粒度分布分辨率对于颗粒的测量是至关重要的,也是评估仪器分辨率的重要条件。但是当前诸多对于粒度分布分辨率的描述都没有给出明确的分辨临界点,也就无法评估仪器的分辨率。作者通过正态分布、RRB分布以及对数正态分布三种颗粒分布模型模拟确立了分辨临界并进行了验证,结果表明所确立的分辨临界是准确而合理的。影响仪器分辨率的评估准确性的另一方面是标准颗粒的选取,其中颗粒的分布参数是选择标准颗粒的关键。在应用分辨临界评估仪器分辨率时,发现分布参数的值越大,评估结果的准确性就会越高。

The particle size distribution resolution is critical for particle measurement, and it is an important condition for resolution assessment of the instruments. But many current descriptions of the particle size distribution resolution can not give a clear resolving critical point, so it is impossible to estimate the resolution of the instruments. We use three particle distribution models which are normal distribution, RRB distribution and log-normal distribution to simulate the resolving critical point and verify it, the results show that it is accurate and reasonable. On the other hand, how to choose the standard particle that is also critical for resolution assessment of the instruments, and the particle distributed parameter is the key to choose the standard particle. When we use the resolving critical point to estimate the resolution of the instruments, we find that the greater the value of the distribution parameters are, the higher accuracy of the results of the assessment will be.