摘要
研究了在Ｇｅ（ＩＶ）—苯基荧光酮（ＰＦ）—溴化十六烷基三甲胺（ＣＴＭＡＢ）测定体系中，Ｆ－对测定微量锗的干扰与消除。本法采用蒸馏分离其它干扰物质，让Ｆ－与Ｇｅ（ＩＶ）同时蒸出，在显色前加入一定量的ＡＬ（Ⅲ）络合Ｆ－，用于实际测定结果满意。
The interference of F- with the microdetermination of germanium and its elimination are experimented in the determing system of Ge(IV)-PF-(TMAB).Distilling separation of the interference substances is adopted to evaporate F-together with Ge(IV).A certaim amount of Al(Ⅲ) is added to complex F-before chromogenic reaction.The determimation results of real samples are satisfactory.
出处
《云南冶金》
1998年第3期48-49,59,共3页
Yunnan Metallurgy
关键词
氟化物
微量锗
分光光度法
氟离子
冶金物料
high fluoride content AL(Ⅲ) masking Ge microdetermination spectrophotometry
