摘要
采用浓硫酸和硫酸铵溶样 ,选用电感耦合等离子体 -原子发射光谱法测定氧化锆中的硅 .基体干扰少 ,测定结果与化学法测定结果相吻合 ,但操作简便 .加料回收率在 98～ 10 6之间 ,相对标准偏差为 2 .5～ 9.1 .
The samples are dissolved by concentrated sulphuric acid and ammonium sulfate,and silicon in zircite is determinated by ICP- AES.The method is simple and accurate.Results obtained by this method are in good agreement with those from the chemical method.The addition recoveries lie between98%～ 1 0 6 % and the relative standard deviations are from2 .5 % to9.1 % .
出处
《广东有色金属学报》
1998年第1期71-74,共4页
Journal of Guangdong Non-Ferrous Metals
关键词
电感耦合
等离子体
原子发射光谱法
氧化锆
硅
inductive coupling plasma- atomic emission spectrometry determination, zircite,silicon
