摘要
集成电路(IC)的迅猛发展促进了测试技术的研究和发展,支持IEEE1149.1标准的边界扫描芯片的广泛应用,使得边界扫描测试技术日益被重视。Tcl语言是一种简明、高效、移植性强的语言,它与边界扫描技术的结合,扩展了芯片测试技术的应用,使得IC的测试更加灵活。本文以DualSRAM的测试设计为例,介绍了以边界扫描技术为基础的Tcl语言的应用,同时根据测试开发中遇到的问题,提出了一些可测性设计(DFT)的建议。
The development of Integrative Circuit（IC）promotes the research and evolution of test technology. The broad use of BoundaryScan chips,which supports IEEE1149. 1 Standard,makes the BoundaryScan technology more and more popular. Tcl language is brief, high efficiency, and replant easily. It combines with BoundaryScan technology and extends the technique of IC test. As a result,IC test technology becomes more agility. This article takes DualSRAM test for example,and introduces the application of Tcl language based on BoundaryScan technology. It gives some advice of DFT at last.
出处
《电子测试》
2009年第6期29-32,共4页
Electronic Test
