X射线管的次级电子

Secondary Electrons in the X-Ray Tubes

本文分析了Ｘ射线管的寄生发光和玻壳的伤的机理，设计了实用的实验，研究了次级电子与管壳内壁电位梯度变化的关系。论述了形成寄生发光和玻壳的的伤的内因和外因，提出了提高质量的对策。

In this paper several useful experimental systems have been designed for study- ing the mechanism of parasitic luminescence and glass bulb damage in the X-ray tubes, The rela- tionship between secondary electrons and electric potential grade on the inside surface of glass bulb is investigated ,the inside cause and the outside cause resulted from parasitic luminescence and glass bulb damage are also discussed. The useful method. to improve the quality of X-ray tubes ,which have been successfully used in some tube ,are presented.