期刊文献+

基于LabVIEW的调试仪提高测量精度的措施

Measures To Improve Metrical Precision of Debug Instrument based on LabVIEW
下载PDF
导出
摘要 高精度是变流装置调试仪的重要技术指标,本文针对基于LabVIEW开发的一套双向变流装置调试仪,从硬件和软件两个方面研究分析了影响其精度的主要原因以及提高其测量精度的几项措施,重点讨论了软件措施中的数字滤波和小波处理技术。并结合试验结果进行了验证。 High precision is an important technology parameter of debug instrument for deflector. This paper introduces a debug instrument developed by LabVIIEW for bidirectional deflector, researches the main causes which affect its precision in the ways of hardware and software, and in due course the measures to improve the metrical precision of it. Special attention is given to digital filtering and wavelet technology. The experimental studies have showed that it works and makes sense.
出处 《微计算机信息》 2009年第16期142-144,共3页 Control & Automation
关键词 LABVIEW 调试仪 测量精度 LabVIEW Debug Instrmnent Metrical Precision
  • 相关文献

参考文献5

二级参考文献24

  • 1彭玉华,汪文秉.小波用于估测散射波波达时间及去噪[J].电子学报,1996,24(4):113-116. 被引量:18
  • 2薛德庆,姚世锋,刘锐,蔡继军.MATLAB在虚拟仪器中的编程应用研究[J].微计算机信息,2006,22(05S):157-159. 被引量:8
  • 3杨宗凯.小波去噪及其在信号检测中的应用[J].华中理工大学学报,1997,25(2):1-4. 被引量:48
  • 4齐泽锋.[D].武汉:武汉大学电气学院,2002.
  • 5Tuteur T W. Wavelet transforms in slngal detection[A]. Proc of the Inter Conf on Wavelet[C].Marseille, France, 1987. 132-138.
  • 6Mallat S, Zhong S. Characterization of signals from multiscale edges[J]. IEEE Transactions on Pattern Analysis and Machine Intelligence, 1992,14(7) : 1019-1033.
  • 7Mallat S. A theory for multisolution signal decomposition: the wavelet representation[J]. IEEE Trans on Pattern Analysis and Machine Inteligence,1989,11(7):674-693.
  • 8Mallat S, Hwang W L. Singularity detection and processing with wavelets [J].IEEE Transactions on Information Theory, 1992,38 (2) : 617 - 643.
  • 9齐泽锋.[D].武汉:武汉大学,2002.
  • 10XIANGKUI WAN, SHUBEN QIN, AIJUN YIN. The Virtual Multi-channel Instrument for Temperature Measurement[C].Proceedings of 2nd ISIST,2002: 397 -401.

共引文献194

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部