摘要
本文利用二苯碘盐为光敏产酸物,吩噻嗪为敏化剂,配制了一种甲酚醛树脂———六甲氧基甲基三聚氰胺(HMMM)负性水型紫外化学增抗蚀剂,并研究了光敏产酸物和增感剂对体系光敏性的影响及体系中存在的拉平效应,通过优化后的光刻工艺条件得到了分辨率为1.24μm的光刻图形.
? A kind of waterbased negative chemical amplified photoresist, composed of NovolacHMMM as the film former, and diphenyliodonium salt as the photosensitive acid generator and phenothiazine as the photosensitizer, was formulated. The effects of photosensitive acid generators and photosensitizers on the photosensitivity of this system, and the levellingeffect in this system were investigated. Based on our research results, the pattern with linewidth as low as 1.24 μm was gained with the conventional UV photolithography under the optimum parameters.
出处
《感光科学与光化学》
CSCD
1998年第2期154-160,共7页
Photographic Science and Photochemistry
基金
国家自然科学基金
关键词
光刻胶
HMMM
集成电路
化学增幅抗蚀剂
增感剂
chemical amplified photoresist, photosensitive acid generator, photosensitizer