摘要
采用自行研制的同位素X射线荧光分析仪,测定工业镀层和汽车涂层厚度,分析精度(RSD)分别达20%和36%,该法具有快速、简便、无损等优点。
Isotopic X_ray fluorescence spectrometer developed by the authors is used to determine the thickness of technical plating or automobile coating.Determination precisions are 20%and 36%,respectively.The method has the advantages of rapidity,simplicity and nondestructive analysis.
出处
《分析测试学报》
CAS
CSCD
1998年第3期61-63,共3页
Journal of Instrumental Analysis
关键词
同位素
X射线荧光光谱
镀层
涂层
厚度
分析
Isotopic X_ray fluorescence spectrometer,Plating,Coating,Thickness