摘要
提出了一种新的相位去包裹算法,主要针对光学光滑表面以及由于少数低调制度点、散斑点、噪声或灰尘(以下简称误差点)引起的去包裹失败的情形。该算法运用泽尼特(Zernike)多项式对误差点区域进行拟合,通过一定阈值的设置,将误差点清除并予以拟合,具有计算快速的特点。
A new phase unwrapping algorithm is presented. It is mainly used in the cases of optical smooth surface with few low modulation and speckle points, no heavy noise. The algorithm is based on Zernike polynomials. It fits the data into Zernike polynomials and filters the unreasonable data through a threshold. The new algorithm shows high speed calculation.
出处
《光学学报》
EI
CAS
CSCD
北大核心
1998年第7期912-917,共6页
Acta Optica Sinica
关键词
干涉术
条纹分析
泽尼特多项式
去包裹算法
interferometry
fringe pattern analysis
Zernike polynomials
phase unwrapping.