摘要
本文采用扣除干扰线强度方法解决了Ti-N化合物中氮的电子探针定量分析问题,为探针分析中处理同级X射线的互相干扰问题提供一种可行的方法。
An improvement by deducting interference method has been developed for treatingthe interference of the same order diffraction X-ray spectrum in electron probe microanalysis.The TiN compound was taken as an example of determination of nitrogen. The result showsthat the method is available.
出处
《金属学报》
SCIE
EI
CAS
CSCD
北大核心
1990年第2期B150-B152,共3页
Acta Metallurgica Sinica
关键词
Ti-N化合物
氮
电子探针
分析
electron probe microanalysis
deducting interference method
nitrogen TiN