期刊文献+

基于综合环境加速寿命试验的电子装备故障预测研究 被引量:16

Fault Prediction Research of Electronic Equipment Based on Composition Environmental ALT
下载PDF
导出
摘要 对某型雷达天控系统的20kHz信号板进行均匀正交试验,利用试验数据对试验结果进行了深层次的分析,总结出温湿度条件下电子装备性能衰退的一般规律;针对在故障预测中占有重要地位的电子装备可靠性预测问题,提出了一种基于综合环境加速寿命试验的电子装备可靠性预测新方法,该方法将性能退化理论拓展为加速性能退化理论,将该理论与传统可靠性预测方法相结合,有效地解决了加速寿命试验中无失效数据的处理问题,最后通过具体的算例验证了该方法的有效性. Make a uniformly orthogonal testing for 20 kHz signal PCB of radar,and use the testing data to analysis the testing results. Conclude the general rule of performance degradation of electronic equipment in the environment of temperature and humidity;Aiming at the electronic equipment reliability prediction problem, which play an important role in fault prediction,present an new method about electronic equipment reliability prediction based on Combine Environmental ALT. This method extends the performance degradation theory to accelerated performance degradation theory. The no failure data problem in ALT was resolved combining the theory and traditional reliability prediction. In the end, validity of this method was proved by an example.
出处 《电子学报》 EI CAS CSCD 北大核心 2009年第6期1277-1282,共6页 Acta Electronica Sinica
基金 国家自然科学基金(No.60472009)
关键词 温湿度试验 金属腐蚀 加速性能退化 故障预测 可靠性预测 temperature and humidity testing metal cauterization accelerated performance degradation testing(APDT) fault prediction reliability prediction
  • 相关文献

参考文献11

  • 1李刚.基于多源信息融合的电子装备故障预测方法研究[D].石家庄:军械工程学院.2006.76-85.
  • 2Zehua Chen, hurong Zheng. Lifetime distribution based degradation analysis[J]. IEEE Transactions on Reliability, 2005,54 (1) :3 - 10.
  • 3Jayaram J S R,Girish T. Reliability prediction through degradation data modeling using a quasi-likelihood approach[ A]. Proceedings Annual Reliability and Maintainability Symposium [ C ]. New York: Institute of Electrical and Electronics Engineers,2005.193 - 199.
  • 4Di Xu, Wenbiao Zhao. Reliability prediction using multivariate degradation data[A]. Proceedings Annual Reliability and Maintainability Symposium[ C] .New York:Institute of Electrical and Electronics Engineers,2005. 337- 341.
  • 5Vladimir Crk. Reliability assessment from degradation data[A]. Proceedings Annual Reliability and Maintainability Symposium [ C ]. New York: Insfitute of Electrical and Electronics Engineers,2000.155 - 161.
  • 6Lu J C,Meeker W Q. Using degradation measures to estimation a time-to-failure distribution [J]. Techno metrics, 1993,35 (2) : 161 - 174.
  • 7Lu J C, Jinho Park, Qing Yang. Statistical inference of a time- to-failure distribution derived from linear degradation data[J]. Techno metrics, 1997,39 ( 4 ) : 391 - 400.
  • 8Meeker M Q, Escobar L A. Statistical Methods for Reliability Data[M] .New York:John Wiley & Sore, 1998.48 - 66.
  • 9陶遵光,曹立新.谈湿热试验结果与长期贮存的相关性[J].表面技术,2000,29(4):31-33. 被引量:2
  • 10贾占强.通用雷达装备板级可靠性评估与试验研究[D].石家庄:军械工程学院,2008.52-57.

二级参考文献3

  • 1防腐包装,1979,:19-30,27.
  • 2防腐消息,1978,(2):37-39.
  • 3邱世荣.表面处理与防腐包装1978年评述[J].防腐包装,1979,:4-6.

共引文献16

同被引文献186

引证文献16

二级引证文献93

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部