摘要
简述了利用迈克耳孙干涉仪测量电致伸缩系数的原理,介绍了测量电致伸缩系数的方法,给出了同心圆干涉条纹的圈数与所加电压的关系以及利用线性回归法求准线性区域的电致伸缩系数的测量结果.
The principle and the techniques of measuring the coefficient of electrostriction with Michelson interferometer are introduced. The dependence of the number of the homocentric interference circles on the voltage bias is analyzed. The measurement result of the coefficient of electrostriction in the quasilinear area with the method of linear regression is given.
出处
《物理实验》
北大核心
2009年第6期4-7,共4页
Physics Experimentation
关键词
迈克耳孙干涉仪
电致伸缩系数
电压
干涉条纹
Michelson interferometer
coefficient of electrostriction
voltage
interference fringe
