一种新型弹头痕迹测量仪

A New Warhead Marks Measuring Instrument

介绍了一种新型的接触与非接触弹头痕迹测量系统,该系统可以获取弹头痕迹的二维平面图像和准确的弹头轮廓高度信息。它由直线相位光栅干涉式大量程位移传感器进行弹头截面轮廓和三维形貌的接触测量,并采用显微镜和CCD摄像装置进行弹头痕迹的非接触图像测量。接触式测量理论测量分辨率可达到0.12nm,测量量程大于2mm,圆周分辨率为2.16',非接触测量横向分辨率5μm。

Introduce a new measuring system for contact and contactless warhead marks＇ measurement. The system could obtain warhead marks＇ two-dimensional images and their exact contour altitude information. It uses interferometrie line phase raster sensor of wide range displacement to have contacted measurements on warhead section contour and its three-dimensional configuration, while put up image contactless measurement on warhead marks by microscope and CCD camera. The measuring distinguishability of its academic contact measurement can be reached at 0.12nm, the measuring range is greater than 2ram, and the circumferential distinguishability is 2.16, while the horizontal distinguishability of contactless measurement is 5μm.