用XRD线形分析法表征TiC粉体中的镶嵌尺寸与晶格畸变

Crystallite Size and Lattice Distortion of TiC from X-ray Diffraction Line Profile Analysis

采用XRD线形分析(双Voigt函数)法对球磨行星96h的TiC粉和纳米TiC粉中的镶嵌尺寸和晶格畸变进行了对比分析和表征,并采用TEM法印证。研究结果表明,球磨粉的平均镶嵌尺寸大约为纳米粉的40%,而球磨粉的平均晶格畸变大约为纳米粉的5倍。TEM的分析结果与XRD表征结果相吻合。

Crystallite size and lattice distortion of TiC powder prepared by planetary ball milling for 96 hours and unmilled nanometer TiC powder were studied by X-ray diffraction line profile analysis （double Voigt function ） method, and the results were verified by TEM observation. It is found that average crystallite size of milled powder is about 40% of that of the unmilled nanao powder, and the lattice distortion of the milled powder is about 5 times of that of the unmilled nano powder. The TTEM results fit well with those of XRD.