摘要
用低压等离子体增强化学汽相沉积法和氮化硅中间过渡层的方法,在硅片和玻璃上,制备了立方氮化碳薄膜.用光电子能谱测试了其成分和结合能,薄膜含氮量为4296%.C1s和N1s的结合能分别为28501和39860eV.透射电子显微镜研究表明,制备的氮化碳属于体心立方结构,根据衍射花样,计算的晶格常量a为0536nm,这与理论预言的结果a为053973nm很接近.随着沉积的时间增长,还观测到了氮化碳薄膜的菊池花样.在玻璃上沉积的氮化碳薄膜在可见光和近红外区域是透明的,在400nm处有光吸收.
Abstract ? Cubic C 3N 4 was synthesized on glass and silicon wafers by using low pressure plasma enhanced chemical vapor deposition and silicon nitride interlayer technology.The crystalline structure was investigated by transmission electron microscopy (TEM),and this material has body centered cubic symmetrical structure.The lattice parameter a =0.536 nm determined by TEM is comparable to theoretical data 0 53973nm.The C1s and N1s binding energies are 285 01 and 398 60eV respectively,and the nitrogen content of the film is up to 42 96%,determined by X ray photoelectron spectroscopy (XPS).The thin films on glass are transparent to light in the visible and near infrared region,and at 400 nm there appears strong light absorption.
出处
《物理学报》
SCIE
EI
CAS
CSCD
北大核心
1998年第6期1047-1051,共5页
Acta Physica Sinica
基金
国家自然科学基金