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AFM扫描图像重构算法的改进 被引量:2

Improvement of Reconstruction Algorithm of AFM Scanning Images
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摘要 针对原子力显微镜(AFM)纳米成像中存在的失真问题,研究了通过探针建模实现AFM扫描图像重构方法.目前探针盲建模算法在重构AFM图像时存在较大误差,因此提出基于探针模型预估计的AFM扫描图像重构方法.该方法采用分区探针针尖建模,并通过基于该探针模型的反卷积运算实现AFM扫描图像重构,获得比较接近真实形貌的AFM扫描图像.文中介绍了算法的具体步骤,通过仿真和实验结果证明,该方法能够有效降低AFM图像重构时引入的误差,得到的图像更能反映样品表面真实的形貌. Atomic force microscope (AFM) images contain distortions induced by the finite size of the tip. Reconstruction of the images allows one to remove the influence of tip shape and analyze the image at the nano-scale. However there are a lot of errors in the reconstruction of the image using blind tip evaluation, and these errors can be eliminated with the new method proposed in the paper based on pre-estimation of the tip. This method builds the tip model based on the zoning of the probe shape, and reconstructs the image by deconvolution of the tip model in order to obtain close to real surface of the sample. This paper gives steps of the algorithm in detail. The simulation and experimental results show that the errors from reconstructing AFM image are reduced, and the reconstructed image can present more surface information of the sample.
出处 《纳米技术与精密工程》 EI CAS CSCD 2009年第3期259-264,共6页 Nanotechnology and Precision Engineering
基金 国家高技术研究发展计划(863)项目(2009AA03Z316) 国家自然科学基金重点项目(60635040) 辽宁省博士启动基金资助项目
关键词 原子力显微镜 多孔铝薄膜 探针盲建模 数学形态学 扫描图像 atomic force microscope (AFM) porous alumina film blind tip evaluation math morphology scanning images
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参考文献13

  • 1Semiconductor Technology [ Z ]. Semiconductor Industry Association, San Jose, CA, 1993.
  • 2Marchman H M, Griffith J E, Filas R W. Fabrication of optical fiber probes for nanometer-scale dimensional metrology [J]. Review of Scientific Instruments, 1994, 65(8) : 2538- 2541.
  • 3Correia A, Perez M, Seenz J J, et al. Nanotechnology applications: A driving force for R and D investment [ J ]. Physica Status Solidi ( A ) , 2007, 204(6) : 1611-1622.
  • 4Todd B A , Rammohan J,Eppell S J. Connecting nanoscale images of proteins with their genetic sequences[ J]. Biophysical Journal, 2003, 84(6) : 3982-3991.
  • 5Binning G, Quate C F, Gerber C. Atomic force microscopy [J]. Phys Rev Lett, 1986, 56(9) : 930-933.
  • 6Villarrubia J S. Morphological estimation of tip geometry for scanned probe microscopy[ J ]. Surface Science, 1994, 321 ( 3 ) : 287-300.
  • 7Keller D J, Franke F S. Envelope reconstruction of probe microscope images [ J ]. Surface Science, 1993, 294 (3): 409-419
  • 8Dongmo L S, Villarrubia J S, Jones S N, et al. Experimental test of blind tip reconstruction for scanning probe microscopy[J]. Ultramicroscopy, 2000, 85(3): 141-153.
  • 9Todd B A,Eppell S J. A method to improve the quantitative analysis of SFM images at the nanoscale [ J ]. Surface Science, 2001, 491(3) : 473-483.
  • 10Tranchida D, Piccarolo S, Deblieck R A C. Some experimental issues of AFM tip blind estimation: The effect of noise and resolution[J]. Meas Sci Technol, 2006, 17 (10) : 2630-2636.

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  • 2吴敏镜.金刚石切削的现状与发展[J].新技术新工艺,2006(1):16-19. 被引量:2
  • 3TOSHIO A, NORIYUKI K. A high-speed atomic force microscope for studying biological macromole- cules[J]. PNAS, 2001, 98(22): 12468-12472.
  • 4BINNING G, ROHRER G. Atomic force micro scope[J]. Physical Review Letters,1986, 56 : 930- 933.
  • 5KOBAYASHI M, SUMITOMO K, TORIMITSU K. Real time imaging of DNA-streptavidin complex formation in solution using a high-speed atomic force microscope[J]. Ultramicroscopy, 2007,107 : 184-190.
  • 6CRAMPTON N, YOKOKAWA M, DRYDEN D T F, et al.. Fast-scan atomic force microscopy reveals that the type III restriction enzyme EcoPlSI is capa- ble of DNA translocation and looping[J]. PNAS, 2007, 104(31) : 12755-12760.
  • 7UKRAINTSEV V A, BAUM C, ZHANG G, et al.. The role of AFM in semiconductor technology development[J]. SPIE 2005, 5752:127-139.
  • 8LEE M. Applications of AFM in semiconductor R&D and manufacturing at 45 nm technology node and beyond[J]. SPIE, 2009, 7272: 736-741.
  • 9KURIHARA M. Gate CD control considering vari- ation of gate and STI structure[J]. IEEE Transac- tions on Semiconductor Manufacturing, 2007, 20 (3) :232-238.
  • 10SCHITTER G, THURNER P J, HANSMA P K. Design and input-shaping control of a novel scanner for high-speed atomic force microscopy [J].Mechatronics, 2008, 18: 282-288.

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