摘要
介绍由单片机控制的智能型半导体二极管测试分选机.文章叙述了其硬件结构、测试原理及软件设计.该仪器能够在微机程序控制下测试二极管主要参数,并可实现自动分档.它不仅测试分选准确,而且工作速度快,可靠性好.
This paper presents an intellingent tesing sorter for semiconductor diodes.It is controlled by a singleslice compater.The paper described the device's hardware structure,software design and testing principle.Under the control of program,the device can test the main parameters of diode and realize automatic sorting.It is not only very accurate,but also has higher work speed and better reliability.
出处
《河北工业大学学报》
CAS
1998年第2期85-89,共5页
Journal of Hebei University of Technology