磁制冷材料钆硅锗系合金中的杂质元素的ICP-AES分析方法的研究

Determination of Impurities in GdSiGe Series Alloys as Magnetic Refrigeration Material by ICP-AES

研究建立了ICP-AES同时测定磁制冷材料钆硅锗系合金中Mo,Mn,Al,V,Ni,Cu,Ga,Fe,Ca(含量范围为质量分数0.1%～1%)9种杂质元素的分析方法。方法的检出限为0.003～0.1μg.ml-1,测定下限为0.02～0.5μg.ml-1,回收率在94%～108%,对于杂质质量分数为0.1%,0.5%,1.0%的样品,其RSD分别为0.40%～2.6%,0.52%～1.1%,0.67%～1.3%,结果表明该方法的精密度和准确度均满足微量分析的要求。

A new method for determination of trace elements, such as Mo, Mn, Al, V, Ni, Cu, Ga, Fe and Ca in magnetic refrigeration material, GdSiGe series alloys, was developed with ICP-AES. Detection limit and determination limit of the method were 0. 003 - 0.1 g· ml^ -1 and 0.02 - 0.5 g· ml^ - 1 respectively. The recovery rate was 94% -108%. The relative standard deviations （ n = 10 ） of the sample （ the content of impurity was 0. 1% ,0.5%, 1.0% ） were 0.40%-2.6% , 0.52%- 1.1%, 0.67%- 1.3% , respectively. The results showed that the method had good accuracy and precision, and could meet the requirements of microanalysis.