摘要
Nonlinear materials have been well established as photo refractive switching material. Important applica- tions of isotropic nonlinear materials are seen in self-focusing, defocusing phenomena, switching systems, etc. The nonlinear correction term is basically responsible for the optical switches. Mach-Zehnder inter- ferometer （MZI） is a well-known arrangement for determining the above correction term, but there are some major problems for finding out the term by MZI. We propose a new method of finding the nonlinear correction term as well as the second order nonlinear susceptibility of the materials by using a modified MZI system. This method may be used to find out the above parameters for any unknown nonlinear material.
Nonlinear materials have been well established as photo refractive switching material. Important applica- tions of isotropic nonlinear materials are seen in self-focusing, defocusing phenomena, switching systems, etc. The nonlinear correction term is basically responsible for the optical switches. Mach-Zehnder inter- ferometer （MZI） is a well-known arrangement for determining the above correction term, but there are some major problems for finding out the term by MZI. We propose a new method of finding the nonlinear correction term as well as the second order nonlinear susceptibility of the materials by using a modified MZI system. This method may be used to find out the above parameters for any unknown nonlinear material.
