Blob分析与亚像素定位算法在LED检测机的机器视觉系统中的应用

The Blob Analysis and Sub-pixel Location Algorithm in Machine Vision System of LED Testing Machine

由于LED大量使用在各种电子产品中,在大批量的生产中要求能更精确更快速地对LED芯片进行检测。本文提出了使用Blob分析和亚像素定位相结合的算法,将其应用在LED检测机的机器视觉系统中,对LED芯片进行测量和定位,然后根据测量出的数据为LED检测机的运动控制系统提供运动数据。

Since the LED has been used in a variety of electronic products, it requires more accurately and more rapid in detection of LED chip when high-volume production are done. In this paper, it gives the use of Blob analysis and combination of sub-pixel location algorithm which is used in vision system of LED testing machine,meanwhile it is measured and located for LED chips. And then it can provide the movement of data for the LED testing machine.