摘要
在万工显的光栅数显和微机测量系统上运用回归分析法,分析建立光栅数显示值误差的数学模型,并编程补偿测量结果,方法简便易行,有效地保证了测量系统的准确度。
Regression analysis method is incorporated into the grating numerical indication (GNI) and the computer measuring system of universal measuring microscope (UMM) in order to establish the mathematical model for compansate the resulting measurements with software. This method facilitates and effectively assures the accuracy of the measuring system.
出处
《宇航计测技术》
CSCD
1998年第4期45-48,共4页
Journal of Astronautic Metrology and Measurement
关键词
光栅
回归分析
示值误差
万能工具显微镜
Universal measuring microscope\ Grating\ Regression analysis Indication error