基于激光图像分析的苹果表面损伤和内部腐烂检测

Apple Surface Damage and Inner Decay Detection Based on Laser Scattering Image Analysis

利用波长650 nm、功率25 mW的半导体激光及计算机视觉技术,初步探讨了利用激光图像分析检测苹果（嘎拉）采后表面损伤和内部腐烂检测的可行性。利用钢球砸伤,模拟苹果在采收和运输过程中受到的损伤;利用微量注射器从苹果底部将15μL（105/mL孢子浓度）的青霉菌液注入果心部位使其腐坏,模拟苹果内部的腐烂。进行激光图像检测试验,结果表明,受损伤后苹果图像像素数S3在36 h达到最高值（3 964）,且在1~84 h内与对照差异显著（P≤0.05）;接种后的苹果随着内部的腐烂,在第4 d时像素数S3达到最高值（3 682）,而后开始下降,第7 d与对照差异显著（P≤0.05）。初步验证本方法检测苹果表面的损伤和内部腐烂是可行的。

The semiconductor laser beam and computer vision technology were used to monitor the surface damage and inner decay of apples （ c. v. gala ）. In the experiments, the damage was produced by falling of a spherical steel ball （diameter： 16 mm, weight： 96 g） on the apples from a height of 20 cm, to simulate the damage caused during the picking and transportation. In order to simulate the inner decay, 15uL suspensions at 10^5/mL conidia of Penicillium ezpansurn was injected into the inner of the apples by a micro-injection. The laser scattering image analysis indicates that the number of the pixels of the images （S3） reached the maximum （3.964） after 36 hours after damaged, and had significant differences with the control group during 84 hours after damaged （P ≤ 0.05 ）. After injecting the suspensions, the number of the pixels of S3 reached the maximum （3 682） on the 4th day, and showed significant differences with the control group on the 7th day （P≤0.05）. This trial laid a theoretical basis for applying low power laser beam to monitor the surface damage and inner decay of apples.