稳态光散射法测粒下限及其影响因素的讨论

Discussion on the lower limit of particle size measuredby the static scattering method and the influencing factors

在经典Ｍｉｅ散射理论基础上，讨论全方位稳态光散射法激光测粒仪测量粒径的下限及其影响因素，认为通过减小激光测粒仪的系统误差和增大探测的散射角范围，可降低测粒仪的测量下限．

Based on the classical Mie scattering theory,the lower limit of particle size measured by the static scattering method in multiple directions and its influencing factors are discussed in this workIt is drawn that the system error of the measurement instrument has to be decreased and the wide range of the scattering angle has to be detected to extend the lower limit of the particle sizer