摘要
高频损耗是薄膜电容器的一个重要的指标,它直接影响整机的可靠性。文章介绍了电容器损耗的概念、损耗的组成、外界因素对损耗的影响;运用试验数据说明薄膜电容器的高频损耗随测试频率的增加而增加,两者之间不是线性关系;通过对薄膜电容器生产过程的分析,指出了高频损耗产生的原因以及应采取的措施,并运用0.618法和正交试验法确定了重要工序的主要参数。
High frequency loss is the important index of film capacitor, it drectly affects the relibility of machine, This article introduces the concept of capacitor loss, the composition of foss, the influence of the loss because of extemal factors ;In this articis test data to explain the high frequency of film Capacitors will be increased with the test frequency increases,they aren＇t the linear telationship. Based on the analysis of capacitor production process ,Pointed out the causes of high-frequency loss, as well as the measures to be taken, and use the method Of 0.618 and the orthogonal test to find the main parameter of important procedure.
出处
《电子质量》
2009年第8期37-39,共3页
Electronics Quality
