摘要
提出了切伦科夫相关时间测量(CCT)中初始粒子在辐射体里产生的δ电子的干扰问题,以及降低干扰的方法。通过模拟计算给出了北京-C工厂探测器初步设计中CCT的π/K分辨本领。
The interference effect from δ electrons created by primary particle passing through radiator in Cherenkov Correlated Timing (CCT) technique is discussed, and the possible method to diminish this interference effect is proposed. The capability for π/K separation is given by Monte Carlo simulation for CCT design of the Beijing Tau-Charm Factory.
出处
《高能物理与核物理》
CSCD
北大核心
1998年第7期577-586,共10页
High Energy Physics and Nuclear Physics
关键词
切伦科夫
探测器
δ电子
τ-C工厂
CCT方法
Cherenkov correlated timing, particle identification, δ electron, Beijing Tau-Charm Factory