摘要
扼要介绍了单晶、多晶、表面及薄膜衍射等各种技术在三个层次(多晶聚集态结构、分子与晶体结构和晶体内微结构)的材料结构表征中的应用。还从衍射仪种类、主要组成部件和重要附件三个方面介绍了X射线衍射试验装置。
The structural characterization of polycrystalline materials, molecule and crystal structure, micro- structure in crystal by X-ray single crystal diffraction, polycrystalline diffraction, surface and film diffraction and other techniques were reviewed. The main assemblies of diffractometers, the types of diffractometer and some important attachments were introduced yet.
出处
《理化检验（物理分册）》
CAS
2009年第8期501-510,共10页
Physical Testing and Chemical Analysis(Part A:Physical Testing)
关键词
X射线衍射
结构表征
衍射装置
X-ray diffraction
structural characterization
diffractometer
