基于扇出因子计算的动态可测性分析方法

A DYNAMIC TESTABILITY ANALYSIS BASED ON RECONVERGENT FANOUT

可测性分析用于指导数字系统的计算机辅助测试与设计．传统的静态可测性分析法可信度差，我们分析了这种原因，发现数字系统的逻辑性在测试生成中随时间（动态）变化是导致静态可测性分析失真的根本原因．据此，提出了一种新的动态可测性分析法．该法以多扇出重汇聚分析为基础，引入新概念扇出因子，成功地刻划了可测性分析的动态性，因而可在线性时空消耗条件下，获得高精度的可测度，并实现冗故障的充分识别．

Testability analysis is used to guide the computer_aided design and automatic test generation of VLSI. Recently, however, testability analysis went into great difficulty due to its low credibility with the increase of integrity degree and complexity. Our study shows that the fundamental cause of the low credibility is the change in the logic behavior of circuits in the progress of the analysis. on this ground, we advanced a new concept, fanout factors, and developed a new dynamic testability analysis measures which is based on the effects of the setting of reconvergent fanouts, with the result that in a linear computing time the testability measures with a high credibility are available.