摘要
在本文中，基于共轭型先验分布与无信息先验分布，对Ｂａｒｌｏｗ＆Ｓｃｈｅｕｅｒ提出的顺序约束的三项分布可靠性增长模型，推导了研制试验的最后阶段之可靠性Ｒｍ与Ａ型失败概率ｐ０的Ｂａｙｅｓ精确限。为了满足工程实践的需要，给出了Ｒｍ的高精度近似限，并用数值例说明了这些方法。
In this paper,based on the conjugate and noninformative prior distribution,the exact Bayesian limits of the reliability Rm of last phase of development lest and the probability p0 of A type fail are derived according to Barlow Scheuer's ordered constraint trinomial distribution reliability growth moded .In order to satisfy the need of engineering practice, accurate approximate limits of Rm are given.And these approachs are illustrated. [WT5”HZ〗
出处
《系统工程与电子技术》
EI
CSCD
1998年第8期74-80,共7页
Systems Engineering and Electronics
基金
国家自然科学基金
关键词
模型
可靠性分析
Bayes限
系统工程
Barlow Scheuer model,Bayesian approach,Reliability growth,Trinomial distribution,Ordered constraint.
