从1149.1标准到1149.7标准分析边界扫描技术的发展

Analysis of Development of Boundary Scan from Standard 1149.1 to 1149.7

边界扫描技术是一种应用于集成电路的测试性结构设计方法,其主要优点在于用极少的电路引脚解决了极为复杂的电路测试问题;伴随着边界扫描技术的发展,已经具有IEEE1149.1、IEEEIEEE1149.4、IEEE1149.5、IEEE1149.6等多个标准,它们所提供的解决方案极大地方便了芯片级、板级、系统级及数字网络的测试;文中对边界扫描的多个协议标准进行了介绍和分析,着重讨论了各个标准的体系结构及功能,最后介绍了边界扫描技术面临的挑战及今后的发展方向。

Boundary scan is a design for the testability of integrate circuit. The major advantage is using a few circuit pins settled to solve the complicated test problem. Coupled with the development of boundary scan, it has developed some standards such as IEEE1149.1, IEEE1149.4, IEEE1149.5, IEEE1149.6. These standards provide solutions to the test of IC level, board level, system level and digital networks. Boundary Scan Test Standards are introduced. It focuses on architecture and the role of each standard. Discuss the challenges which boundary scan is faced . At last, the future direction of boundary scan techniques is expected.