期刊文献+

一种嵌入式系统中软硬件故障的划分方法 被引量:2

A Software/Hardware Fault Partitioning Method in Embedded System
下载PDF
导出
摘要 软硬件故障是嵌入式系统可靠性的关键问题之一,如何划分软硬件故障对于整个系统的可靠性研究来说是至关重要的,也是最基本的一步。给出了软硬件故障的基本定义,并与单纯的软件故障和单纯的硬件故障进行了对比,总结了软硬件故障的基本特点。在此基础上,归纳了几条软硬件故障的划分原则,提出了一种软硬件故障的划分流程,并通过形式化方法对某装备的具体软硬件故障进行了划分,为进一步的研究提供了有力的依据。 Software/hardware fault is one of the key-questions in embedded system, it's crucial and basic to the whole system of reliability that how to partition software/hardware fault. In this paper, software/hardware fault is defined. Comparing with the single hardware fault and the single software fault, the characteristics are summed up. Based on these, some software/hardware fault partitioning principle are concluded, and one of software/hardware fault partitioning flow is introduced, and a material software/hardware fault in the equipment is partitioned by formal method. According as these, the next research is feasible.
出处 《火力与指挥控制》 CSCD 北大核心 2009年第8期38-40,共3页 Fire Control & Command Control
基金 第二炮兵科研项目
关键词 嵌入式系统 软硬件故障 形式化划分方法 embedded system,software/hardware fault ,formal partitioning method
  • 相关文献

参考文献4

  • 1刘穆进,徐拾义.软硬件测试的一致性[J].同济大学学报(自然科学版),2002,30(10):1186-1189. 被引量:7
  • 2赵敏媛,吕钊,顾君忠.嵌入式系统的软硬件划分[J].微计算机应用,2005,26(3):265-268. 被引量:2
  • 3Xiang J W, He Y X. Fault Tree and Formal Methods in System Safety Analysis [J]. IEEE, 2004,20(5) : 236-244.
  • 4Allen P N. Inserting Software Fault Measurement Techniques Into Development Efforts[J].IEEE, 2000,10(1) : 274-275.

二级参考文献17

  • 1Ohtake S,Inoue T,Fujiwara H.Sequential test genera tion based on circuit pseudo-transformation[A].Proceedings of the 5th Asian Te st Symposium[C].Taiwan:Institute of Electrical and Electronics Engineers,1997. 62-67.
  • 2Waicukauski J A,Lindbloom E,Rosen B,et al.Transition fault simulation[J].IEEE Design and Test of Computers,1987,(4):32-38.
  • 3Ramamoorthy C V,Bastani F B.Modelling of software reliabil ity growth process[A].Proc COMPSAC 1980[C].Chicago:COMPSAC,1980.161-169.
  • 4Ramamoorthy C V,Bastani F B.Software reliability--status and perspectives[J].IEEE Trans Soft Eng,1982,(4):354-371.
  • 5Savaria Y.A pragmatic approach to the design of self-testi ng circuits[A].1989 Int Test Conf[C].Washington:IEEE Pub,1989.745-754.
  • 6Wagner K D,Chin C K,Mc Cluskey E J.Pseudorandom testing[J ].IEEE Trans on Computers,1987,C-36(3):332-343.
  • 7Malaiya Y K.Antirandom testing:Getting the most out of bla ck-box testing[A].Sixth Int Symp on Soft Reliability Engineering[C].Tou Lous e:[s.n.],1995.86-95.
  • 8Cheng K T,Agrawal V D.A partial scan method for sequ ential circuits with feedback[J].IEEE Trans Comp,1990,39(4):538-544.
  • 9Kim K S,Kime C R.Partial scan flip-flop selection by use of empirical testability[J].JETTA,1995,7(1-2):47-60.
  • 10Weiser M.Program slices:Formal,psychological,and practical investigation of an automatic program abstraction method[D].Ann Arbor:University of Michiga n,1979.

共引文献7

同被引文献13

引证文献2

二级引证文献7

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部