高功率微波对等离子体限幅器加热效应分析

Thermal Effect of Plasma Limiter Induced by High Power Microwave

等离子体限幅器利用入射的高功率微波电离气体,产生等离子体;该等离子体反射和吸收微波能量,保护电子设备不受来袭高功率微波损毁。基于射线跟踪理论,研究高功率微波透射功率随等离子体频率和电子碰撞频率的变化规律,分析加热效应对等离子体限幅器件防护性能的影响。对于长脉冲高功率微波,计算结果表明:随着温度升高,等离子体频率增高,使得微波透射功率减小,防护效果得以改善。在低气压限幅器中,考虑电子碰撞频率影响,选用Xe作为电离气体产生等离子体,能使限幅器更有效地发挥效能。

Plasma limiter is a sealed gas chamber. It can reflect and absorb microwave to protect electronic systems, when gas in the limiter becomes Plasma excited by incident High Power Microwave （HPM）. The effects of plasma frequency and electron collision frequency, and thermal effect of the limiter are studied by HPM based on ray tracing theory. For long HPM pulses, the results show that the protective performance is improved while temperature increases, because the transmitted power of HPM decreases as the plasma frequency increases. Plasma limiter filled with Xe could work more effectively by taking electron collision frequency into consideration.