摘要
建立了基于采集卡和Lab View的正交锁相放大测量系统,探测超光滑表面散射光强(nW量级)。分析了该系统对外界杂散光干扰和电气噪声的消除和削弱能力。利用该系统和硬件锁相放大器SR830分别测量光电调制信号,两者抑制噪声和还原信号能力一致,前者可替代后者。
A two - phase lock - in amplifier system based on DAQ Board and Lab View is built to measure the scatter light of superpolished surface, which is several nW or less. It is analyzed how this system can eliminate the confusion of environment stray light and weaken the electronic noise. When applied to measure modulated photoelectric signal, this system has the same capability of noise supprer, sion and signal recovery as hardware Lock - in amplifier SR830.
出处
《激光杂志》
CAS
CSCD
北大核心
2009年第4期71-72,共2页
Laser Journal
