摘要
为了诊断Z箍缩等离子体电子温度,研究了氩的双电子伴线与类氦共振线的强度比和等离子体电子温度的关系。利用椭圆弯曲晶体谱仪在"阳"加速器上探测X射线光谱,采用X射线胶片接收信号。针对谱仪获取的氩的类氦谱线及类锂伴线,计算了伴线k与共振线w的强度比以及伴线j与禁戒谱线z之和与共振线强度比,利用伴线与共振线强度比值和等离子体电子温度的关系诊断出电子温度为960~1060keV,实验结果证明谱线强度比值法是一种探测电子温度很有效的诊断方法。
To diagnose the electron temperature of a Z-pinch plasma,the ratio between the dielectronic recombination satellite line for argon to the w-resonance line for lithium-like as a function of the plasma temperature is analyzed. The spectral emission pattern of helium-like argon together with the associated satellite line from lithium-like argon have been measured with an X-ray elliptical curved crystal spectrometer on a Yang accelerator. The spectrum of argon-puff Z-pinch plasma is described by a curved mica crystal analyzer and the helium-like resonance line w, satellites j, k, q, magnetic quadrupole M2 line, intercombination line y, forbidden line z and the cold Ko line of argon are recorded with an X-ray film. Then,the line ratios between the dielectronic recombination satellites (j+z, k) to the w-resonance line are calculated, obtained results show that the electron-temperatures of the plasma are 960-1 060 keV. The theoretical models are in agreement with the experimental results well,which supports the conclusion that proposed method can be used in a temperature diagnostic method for plasma.
出处
《光学精密工程》
EI
CAS
CSCD
北大核心
2009年第8期1819-1824,共6页
Optics and Precision Engineering
基金
国家自然科学基金NSAF联合基金资助项目(No.10576041)