BIST在SoC片上嵌入式微处理器核上的应用

Application of BIST in SoC Based Embedded Microprocessor Core

介绍了SoC片上嵌入式微处理器核的一种测试技术——片内测试(BIST)。讲述了片上系统的由来以及两个重要特点。与传统的测试方法比较后,讨论了MemBIST、LogicBIST等常用BIST测试技术的结构和特点,分析了这几种测试方法的优缺点。

Built-In Self-Test(BIST),a test methodology in SoC design of embedded microprocessor core,is introduced. The origin of system on chip and its two important features are presented.Compared with the traditional testing method,MemBIST and LogicBIST methods and their characteristics are discussed. Finally,advantages and disadvantages of these testing methods are analyzed.