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多线切割工艺中切割线直径对翘曲度影响的研究 被引量:6

A Basic Study on the Relation between Wire Diameter and Wafer Warp
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摘要 目前,在硅单晶锭切割领域多线切割机已得到广泛的应用。切割砂浆及切割线在切割中有着极其重要的作用,不同的使用条件会直接影响切割晶片的几何参数。主要讨论切割线直径的不同对切割出晶片几何参数的影响。 At present, the multi-wire saw machine is widely used in cutting silicon material field. The slurry and steel wire take the most important role in the cutting, Different using conditions may affect the geometry parameters of the wafer. And different diameter of the wire may change the quality of the wafer was mainly studied in this article.
作者 李保军 冯涛
出处 《电子工业专用设备》 2009年第8期16-19,共4页 Equipment for Electronic Products Manufacturing
关键词 多线切割 切割线直径 翘曲度 Multi-wire saw Wire diameter Warp
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参考文献4

  • 1P. O. Hahn. The 300 mm silicon wafer-A cost and technology challenge, [J]. Microelectronic Engineering, 2001, May,56(1/2):3-13.
  • 2夏海良.半导体器件制造工艺[M].上海:上海科学技术出版社,1985..
  • 3I. Kao (PI) and V. Prasad, J. Li, M. Bhagavat Department of Mechanical Engineering [Z]. SUNY Stony Brook, NY 11794-2300.
  • 4A Basic Study on Slurry Actions and Slicing Characteristics of Multi-wire Saw Hitoshi SUWABE Institute of Technology 1-2-10 Sakae[Z]. Tachikawa, 190-8533, Japan.

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