摘要
YBCO textured thick film was prepared by direct peritectic growth method. Microstructure of the film was characterized. Electron backscattered diffraction （EBSD） technique was applied to the film for quantitative texture analysis. The main difficulty in resolving the orientation of YBCO pseudo-cubic structure was investigated. Automated orientation mapping was performed on YBCO thick film. Local texture was presented in the form of orientation maps. Misorientation distribution and crystal growth characterization in the YBCO thick film were revealed. Large domains with well-aligned YBCO grains were formed. Each domain presented clear in-plane and out-plane textures.
YBCO textured thick film was prepared by direct peritectic growth method. Microstructure of the film was characterized. Electron backscattered diffraction （EBSD） technique was applied to the film for quantitative texture analysis. The main difficulty in resolving the orientation of YBCO pseudo-cubic structure was investigated. Automated orientation mapping was performed on YBCO thick film. Local texture was presented in the form of orientation maps. Misorientation distribution and crystal growth characterization in the YBCO thick film were revealed. Large domains with well-aligned YBCO grains were formed. Each domain presented clear in-plane and out-plane textures.
