利用原子力显微技术对神经胶质细胞超微结构及其相互问的纳米连接结构的观察

Observation of Glial Ultrastructure and Connection Structures with Atomic Force Microscopy

本研究利用原子力显微技术(AFM)观察原代培养的神经胶质细胞及其相互间的纳米连接结构。选择生长良好的神经胶质细胞用戊二醛固定30分钟,固定于AFM基底上进行扫描成像,用AFM脱机软件(SPM OFFLINE 2.20)进行检测。观察到胶质细胞平铺于培养皿的底部,胞体形状不规则,表面较扁平。突起丰富,但没有极性,无轴突树突之分,还观察到两胶质细胞间存在长程纤维管状连接结构。

To investigate the ultrastructure and the connection structures between primarily cultured neuroglial cells, the atomic force microscopy （AFM） was used. Well-growing neuroglial cells were fixed with glutaraldehyde for 30 min, the bottom of the culture dish with the interesting structures was rapidly cut into appropriate sheets and immobilized onto the base of AFM, which was then put onto the top of the AFM scanner in the atmosphere chamber for imaging. Neuroglial cells displayed flat membrane surface with uneven and irregular undulation. The processes are rich but the cell body has no polarity. The fiber-tubular connections（FTC） between two remote neuroglial cells were also found.