摘要
由InP薄板组成的平板光子晶体微腔,从其谐振模式获得横向极化的共振散射和二次谐波光谱成为一种新方法。这些技术可以用来对不包含共振发光层的大型微腔阵列做快速有效的检测。谐振腔是在包含周期性椭圆空气孔的六边形平板光子晶体上形成单一缺陷而得到的。这些谐振腔通常支持两个正交偏振的共振模式,使用一组相关的洛仑兹函数可以很好地拟合共振散射谱和谐波光谱。这些技术的相对优点在于与更常用的谐振腔加强型光致发光技术的定量比较上。
The resonant modes of two-dimensional planar photonic crystal microcavities patterned in a free-standing InP slab are probed in a novel fashion which is used to obtain cross- polarized 1,esonant scattering and second-harmonic spectra. We show that these techniques can be used to do rapid effective assays of large arrays of microcavities that do not necessarily contain resonant light-emitting layers. The techniques are demonstrated using microeavities comprised of single missing-hole defects in hexagonal photonic crystal hosts formed with elliptically shaped holes. These cavities typically support two orthogonally polarized resonant modes, and the resonant scattering and harmonic spectra are well fitted using a coherent sum of Lorentzian functions. The relative merits of these techniques are quantitatively compared with the more commonly used cavity-enhaneed photolumineseenee technique.
出处
《光学仪器》
2009年第4期58-61,共4页
Optical Instruments
关键词
平板光子晶体
微谐振腔
共振散射
二次谐波光谱
planar photonic crystal(PPC)
microcavity
resonant scattering
second-harmonic spectra