摘要
针对基于将X光转换成可见光接收的硬X光光电成像系统,研究了系统面密度分辨能力的理论模型,获得了系统面密度分辨能力的上下限的表达式;建立了对硬X光成像系统对面密度分辨能力的测量方法。利用自制面密度分辨率板,实验测量了由射频X光机、转换屏、光纤锥耦合和CCD相机组成的硬X光光电成像系统在不同照射量下的面密度极限分辨能力的上下限值。实验结果与理论分析模型分析趋势一致,在未饱和条件下面密度分辨力上限随着照射量的增加而不断增加,而面密度分辨力下限随着照射量的增加将减小。
Hard X-ray radiography is a technique widely used to diagnose inner information of matters. It is necessary to study the areal density（AD） resolution of hard X-ray imaging systems, because areal density is an important measurement of density, thickness and quality. In this paper, the model of AD resolution is derived and a new method of measurement for AD resolution is established. Using the self-made AD resolution plate, AD resolution limit of the hard X-ray imaging system, which is composed of scintillator, fiber bundle and CCD camera, is experimentally obtained under different exposures. Experimental data agree with the model curve in tendency, that is, the maximal AD resolution increases with the growth of the exposure, while the minimum AD resolution decreases.
出处
《强激光与粒子束》
EI
CAS
CSCD
北大核心
2009年第10期1467-1470,共4页
High Power Laser and Particle Beams
基金
国防科技基础研究基金项目
关键词
硬X光
成像系统
面密度
照射量
转换屏
hard X-ray radiography
imaging system
areal density
exposure
scintillator
