电力半导体散热器热阻测试中的平均值测量法

The Mean Value Survey Law for Thermal Resistance Test of Power Semiconductor Radiator

在电力半导体用散热器热阻测试中,热阻值的大小除了与其自身结构﹑冷却介质和温度测量有关外,耗散功率的产生、测量和计算也是其中一个重要因素,并且,直接测量方法的测试结果比间接方法更为准确。利用GB/T8446.2-2004中规定的方法等效变换,通过推导给出了简约计算公式。其结果可较方便地用于热阻测试,减少了中间测试和计算环节,提高了散热器热阻参数的测试效率及准确度。在实际测试应用时,有效快捷,具有较高的实用性。

In the radiator thermal resistance tests of the power semiconductor,the thermal resistance relates to its own structure,cooling medium and temperature survey related,in addition,dissipated power＇s production,the survey and the computation are important factors in the test.And the test result of direct measurement method is more accurate than the indirect method.Using the GB/T8446.2-2004 stipulation equivalent transformations,through the inferential reasoning process,the brief formula is given.The results can be conveniently used in the thermal resistance test to reduce the middle test and the computation link ,and raise testing efficiency and accuracy of the radiator thermal resistance parameter.In actual test application,the method works effectivly and quickly, and it has the usability.