商用FPGA器件的单粒子效应模拟实验研究

Simulation Experiment of Single Event Effect in Commercial FPGA

描述了商用Xilinx Virtex-II Pro器件的重离子辐射实验,以评估器件的单粒子翻转(SEU)特性并检验测试方法的有效性。针对器件不同的功能模块设计不同的实验方案,分别测试了FPGA配置信息,内嵌PowerPC处理器和RocketIO Gbit收发器的单粒子翻转截面,并对观察到的错误进行分析与分类。实验同时表明配置信息的周期刷新和三模冗余设计是减轻单粒子效应的有效方法。

Heavy-Ion radiation experiments are performed to evaluate the SEU sensitivity of commercial Virtex-II Pro devices, as well as the effectiveness of the test system. Different submodules are tested under specific test modes and upset cross sections are estimated respectively. Observed upsets are analyzed and classified. The test also shows that Triple Module Redundaney （TMR） in combination with regular configuration scrubbing is a quite effective SEU mitigation method and necessary for upset isolation.