期刊文献+

Effect of Sample Configuration on Droplet-Particles of TiN Films Deposited by Pulse Biased Arc Ion Plating

Effect of Sample Configuration on Droplet-Particles of TiN Films Deposited by Pulse Biased Arc Ion Plating
下载PDF
导出
摘要 Orthogonal experiments are used to design the pulsed bias related parameters, including bias magnitude, duty cycle and pulse frequency, during arc ion deposition of TiN films on stainless steel substrates in the case of samples placing normal to the plasma flux. The effect of these parameters on the amount and the size distribution of droplet-particles are investigated, and the results have provided sufficient evidence for the physical model, in which particles reduction is due to the case that the particles are negatively charged and repulsed from negative pulse electric field. The effect of sample configuration on amount and size distribution of the particles are analyzed. The results of the amount and size distribution of the particles are compared to those in the case of samples placing parallel to the plasma flux. Orthogonal experiments are used to design the pulsed bias related parameters, including bias magnitude, duty cycle and pulse frequency, during arc ion deposition of TiN films on stainless steel substrates in the case of samples placing normal to the plasma flux. The effect of these parameters on the amount and the size distribution of droplet-particles are investigated, and the results have provided sufficient evidence for the physical model, in which particles reduction is due to the case that the particles are negatively charged and repulsed from negative pulse electric field. The effect of sample configuration on amount and size distribution of the particles are analyzed. The results of the amount and size distribution of the particles are compared to those in the case of samples placing parallel to the plasma flux.
出处 《Journal of Materials Science & Technology》 SCIE EI CAS CSCD 2009年第5期681-686,共6页 材料科学技术(英文版)
基金 supported by the National Natural Science Foundation of China under grant No.50801062
关键词 Arc ion plating Pulsed bias TiN film Droplet-particles Arc ion plating Pulsed bias TiN film Droplet-particles
  • 相关文献

参考文献22

  • 1J. Fessman, W. Olbrich and G. Kampschulte: Mater.Sci. Eng., 1991, A140, 830.
  • 2W. Olbrich and G. Kampschulte: Surf. Coat. Technol., 1993, 59, 274.
  • 3M. Kumagai, K. Yukimura, E. Kuze, T. Maruyama, M. Kohata, K. Numata, H. Saito and X.X. Ma: Surf. Coat. Technol., 2003, 169/170, 401.
  • 4R.R. Aharonov, M. Chhowalla, S. Dhar and R.P. Fontana: Surf. Coat. Technol., 1996, 82, 334.
  • 5Z.Y. Li, W.B. Zhu, Y. Zhang, G.Y. Li and E.Y. Cao: Surf. Coat. Technol., 2000, 131, 158.
  • 6M.D. Huang, G.Q. Lin, C. Dong, C. Sun and L.S. Wen: Acta Metall. Sin., 2003, 39, 510.
  • 7M.D. Huang, G.Q. Lin, Y.H. Zhao, C. Sun, L.S. Wen and C. Dong: Surf. Coat. Technol., 2003, 176, 109.
  • 8Y.H. Zhao, G..Q. Lin, C. Dong and L.S. Wen: J. Mater. Sci. Technol., 2005, 21,423.
  • 9G.Q. Lin, Y. H. Zhao, H.M. Guo, D.Z. Wang and C. Dong: J. Vac. Sci. Technol., 2004, A22, 1218.
  • 10M. Keidar, R. Aharonov and I.I. Beilis: J. Vac. Sci. Technol., 1999, A17, 3067.

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部