基于IEEE 1149.4标准的混合电路测试系统设计

Design of Mixed-signal Circuit Test System Based on IEEE1149.4 Standard

随着电子技术的迅速发展,电路系统的复杂度急剧增加,目前约有60%的芯片同时包含了数字和模拟两种信号,电路测试也因此面临着更大的挑战。为解决数模混合信号系统的测试难题,在IEEE 1149.4标准的基础上,设计了一个数模混合电路测试系统方案,系统能够实现混合电路的互连测试与参数测试,通过74BCT8373与STA400芯片对系统的测试功能进行了验证。实验结果表明,该系统测试简单,测量准确。该测试系统的研究设计为下一步进行混合电子系统机内测试设计奠定了基础。

With the fast development of elect ronic technology, the comp lexity of the elect ro circuits system increased sharply, most chips （ about 60% ） include both the digital signal and analog signal at the same time, and test of circuits faces the newchallenge. Based on the IEEEl149.4 standard , a scheme of mixed--signal circuit test system is designed, which can realize the interconnect test and parametric test of mixed--signal circuit, and the test function of the system is validated by 74BCT8373 and STA400. Experiment result indicates that this system can make test easy and accurate. The design of this test system settles the foundation of built- in test for mixed-- signal electronic system.