基于灰关联熵的模拟电路测试点优选算法

Algorithm of selecting optimal test point for analog circuit based on grey relational entropy

选择最佳测试点是电路故障诊断的重要课题。将模拟电路看作灰色系统,对模拟电路进行灰关联熵分析,利用灰熵关联度量化测试点与故障元件之间的关联程度,从而得到故障诊断的最佳测试点。通过两个典型电路的实例表明,将灰关联熵分析用于测试点优选,具有算法简单、所需样本少、结果明确等优点,保证了测试点选择的客观性。

The selection of optimal test point is the important subject in circuit fault diagnosis. Analog circuit is regarded as grey system, grey relational entropy is applied to analyze the analog circuit. The relational degree between test point and fault component is quantified using grey entropy relational degree, thereby the optimal test point can be selected easily. Two examples of typical circuit are provided. The result shows that this method has the advantages of simple algorithm, less sample consumption, objective result, and ensures the objectivity of selecting test point.