摘要
在SILEX-Ⅰ激光装置上,采用半影成像技术对超短超强激光与纳米靶作用产生的Kα源进行了空间二维成像,获得了分辨率为10μm左右的图像.与国外的结果相比,在较小能量激光器上高质量地实现了铜Kα源空间二维半影成像.实验表明,半影成像能得到详细的Kα源空间分布的细节信息,优于刀边成像等一维成像技术.
At the SILEX-Ⅰlaser facility,penumbral imaging technique was used to record a Kα source in two dimensions.Due to the fact that the source was produced via the interaction between ultrashort-ultraintensity laser and Velvet target,we can obtain high quality Kα source images.More details about the source spatial distributions can be deduced from the two-dimensional imaging than that from the one-dimensional imaging such as knife edge imaging.
出处
《物理学报》
SCIE
EI
CAS
CSCD
北大核心
2009年第10期7074-7078,共5页
Acta Physica Sinica
基金
高温高密度等离子体国家重点实验室基金(批准号:9140C6801020801)
中国工程物理研究院重大基金(批准号:2006Z0202)资助的课题~~
关键词
Kα源
半影成像
纳米靶
Kα source
penumbral imaging
nanostructure target